Stress Probability Computation for Estimating NBTI-Induced Delay Degradation

Static Aging Analysis Using 3-Dimensional Delay Library

The growing concern about time-dependent performance variations of CMOS devices due to aging-induced delay degradation has increased with shrinking technology dimensions of the devices . One of the main causes of aging is Negative Bias Temperature Instability (NBTI). Modeling NBTI-induced delay at gate level depends on the real stress activity of gate inputs which are related to the workload ap...

بررسی و مدل‌سازی اثر ناپایداری در دمای بالا و بایاس منفی (NBTI) و تزریق حامل‌های پرانرژی (HCI) در افزاره‌های چندگیتی نانومتری

In this paper, analytical models for NBTI induced degradation in a P-channel triple gate MOSFET and HCI induced degradation in an N-channel bulk FinFET are presented, through solving the Reaction-Diffusion equations multi-dimensionally considering geometry dependence of this framework of equations. The new models are compared to measurement data and gives excellent results. The results interpre...

Simulation-Based Analysis For NBTI Degradation In Combinational CMOS VLSI Circuits

The negative-bias temperature instability (NBTI) is one of the dominant aging degradation mechanism in today Very Large Scale Integration (VLSI) Integrated Circuits (IC). With the further decreasing of the transistor dimensions and reduction of supply voltage, the NBTI degradation may become a critical reliability threat. Nevertheless, most of the EDA tools lack in the ability to predict and an...

Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability

NBTI Mitigation Method by Inputting Random Scan-In Vectors in Standby Time

Negative Bias Temperature Instability (NBTI) is one of the serious concerns for long-term circuit performance degradation. NBTI degrades PMOS transistors under negative bias, whereas they recover once negative bias is removed. In this paper, we propose a mitigation method for NBTI-induced performance degradation that exploits the recovery property by shifting random input sequence through scan ...